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Refractive index of thin, aqueous films between hydrophobic surfaces studied using evanescent wave atomic force microscopy

Refractive index of thin, aqueous films between hydrophobic surfaces studied using evanescent wave atomic force microscopy

CT McKee, WA Ducker – Langmuir, 2005 – ACS Publications
… The evanescent wave was generated using a 532-nm diode laser (TECGL-10, World Star Tech,
Toronto, Canada). The scattered evanescent light was collected with a Nikon LU Plan 50×/0.55
objective and transferred to a photomultiplier tube (H5784-20 Hamamatsu). figure …
https://scholar.google.ca/citations?user=yhD3140AAAAJ&hl=en&oi=sra

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